Measurement process - Research Data Management in Metrology

Semantic resources: measurement process

These resources describe measurement processes including methods, instruments and calibration procedures. The associated metadata contains information about measurements and calibration data, including software, instruments and anyone involved in the measurement.

An Ontology for the Materials Design Domain

Paper: https://doi.org/10.48550/arXiv.2006.07712

Ontology: https://github.com/LiUSemWeb/Materials-Design-Ontology

Example case study that uses this ontology: https://huanyu-li.github.io/posters/mdo-poster-paper276.pdf

Description: Materials Design Ontology, concepts and relations representing knowledge in materials design. Designed using domain knowledge in materials science with focus on solid-state physics.

Why we like it: Thoroughly documented from introductory information to underlying axioms. Easily accessible.

SmartCOM Digital Calibration Certificate XSD schema

Paper: https://zenodo.org/doi/10.5281/zenodo.3696566

Resource: https://dccwiki.ptb.de/en/home

Example case study that uses the schema: https://doi.org/10.3390/metrology2010003

Description: an XML schema to capture, store and exchange calibration certificates.

Why we like it: comprehensive online documentation, easy access, growing adoption in the metrology community, demonstrators and good practice guides available.